The Electrical Characterisation Laboratory
The laboratory is fully equipped to perform a wide range of electrical measurements in a variety of nano-scale devices as well as electrical techniques to identify and detect molecules. It has the capability of doing low-level measurements (Nano-volts, fento-Amps) in high resistive materials crucial for addressing ultra-small device structures. These measurement can be performed over a very large temperature range (10K-500 K) There are also available high bandwidth techniques such as time domain reflectometry (TDR) and network analysis important to address biomolecules in wet environments and in the development of bimolecular devices. Very recently we add a state-of-art electrical noise measuring system as part of a plan to develop fast diagnostic and reliability tool required in the electronics industry.
Techniques available:
I-V measurements (fento-Amps, Nano-Volts)
C-V profiling
Impedance spectroscopy (20 Hz-1 MHz)
Photo-response
Transient response
Deep level transient spectroscopy (low frequency DLTS)
Thermal stimulated detrapping (TSC, TSCAP)
Electrical noise measurements (1/f and RTS type of noise)
Photo of the electronics lab at the University of the Algarve:
